2000 IEEE International Integrated Reliability Workshop Final Report
Stanford Sierra Camp Lake Tahoe, California October 23-26, 2000
- ISBN
-
9780780363922
- Antal sider
-
199
- Udgivet
-
1. januar 2001
- Format
-
Paperback
- Størrelse
-
10.8 x 8.2 x 0.5 inches
- Vægt
-
1.4 pounds
- Udgave
-
6
- Sprog
- Engelsk
Congresses
Electronic devices & materials
Electronics - Circuits - General
Integrated circuits
Quality Control
Reliability
Reliability Engineering
Naturvidenskab/matematik
Technology
Technology & Industrial Arts
Wafer-scale integration
